Material discrimination and mixture ratio estimation in nanocomposites via harmonic atomic force microscopy

Harmonic atomic force microscopy (AFM) was employed to discriminate between different materials and to estimate the mixture ratio of the constituent components in nanocomposites. The major influencing factors, namely amplitude feedback set-point, drive frequency and laser spot position along the cantilever beam, were systematically investigated. Employing different set-points induces alternation of tip-sample interaction forces and thus different harmonic responses. The numerical simulations of the cantilever dynamics were well-correlated with the experimental observations. Owing to the deviation of the drive frequency from the fundamental resonance, harmonic amplitude contrast reversal may occur. It was also found that the laser spot position affects the harmonic signal strengths as expected. Based on these investigations, harmonic AFM was employed to identify material components and estimate the mixture ratio in multicomponent materials. The composite samples are composed of different kinds of nanoparticles with almost the same shape and size. Higher harmonic imaging offers better information on the distribution and mixture of different nanoparticles as compared to other techniques, including topography and conventional tapping phase. Therefore, harmonic AFM has potential applications in various fields of nanoscience and nanotechnology.